Strong Interfacial Charge Trapping in Ultrathin SrRuO<sub>3</sub> on SrTiO<sub>3</sub> Probed by Noise Spectroscopy-Reference-Cited by-同舟云学术

Strong Interfacial Charge Trapping in Ultrathin SrRuO₃ on SrTiO₃ Probed by Noise Spectroscopy

Published:2022-06-15 Issue:24 Volume:13 Page:5618-5625
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Lee Jung-Woo¹,Kim Jiyeong²,Eom Kitae³,Jeon Jaeyoung²⁴,Kim Young Chul²⁴,Kim Hwan Sik²⁴,Ahn Yeong Hwan²⁴^ORCID,Kim Sungkyu⁵^ORCID,Eom Chang-Beom³,Lee Hyungwoo²⁴^ORCID

Affiliation:

1. KIURI Institute, Yonsei University, Seoul 03722, Republic of Korea

2. Department of Physics, Ajou University, Suwon 16499, Republic of Korea

3. Department of Materials Science and Engineering, University of Wisconsin−Madison, Madison, Wisconsin 53706, United States

4. Department of Energy Systems Research, Ajou University, Suwon 16499, Republic of Korea

5. Department of Nanotechnology and Advanced Materials Engineering, Sejong University, Seoul 05006, Republic of Korea

Funder

Gordon and Betty Moore Foundation

Ministry of Science and ICT, South Korea

U.S. Department of Defense

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.2c01163

Reference31 articles.

1. Structure, physical properties, and applications ofSrRuO3thin films

2. Emergence of room-temperature ferroelectricity at reduced dimensions

3. Imprint Control of BaTiO3 Thin Films via Chemically Induced Surface Polarization Pinning

4. Direct measurement of strain effects on magnetic and electrical properties of epitaxial SrRuO3 thin films

5. Modulation of Spin–Orbit Torque from SrRuO 3 by Epitaxial‐Strain‐Induced Octahedral Rotation

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