Origin of the High Selectivity of the Pt–Rh Thin-Film H2 Gas Sensor Studied by Operando Ambient-Pressure X-ray Photoelectron Spectroscopy at Working Conditions-Reference-Cited by-同舟云学术

Origin of the High Selectivity of the Pt–Rh Thin-Film H₂ Gas Sensor Studied by Operando Ambient-Pressure X-ray Photoelectron Spectroscopy at Working Conditions

Published:2022-09-06 Issue:36 Volume:13 Page:8546-8552
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Toyoshima Ryo¹,Tanaka Takahisa²^ORCID,Kato Taro²,Uchida Ken²^ORCID,Kondoh Hiroshi¹^ORCID

Affiliation:

1. Department of Chemistry, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama, Kanagawa 223-8522, Japan

2. Department of Materials Engineering, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, 113-8656, Japan

Funder

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.2c02365

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1. Medical applications of breath hydrogen measurements

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5. Nanoscale Pt thin film sensor for accurate detection of ppm level hydrogen in air at high humidity

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