Resolving Multi-Asperity Contacts at the Nanoscale through Super-Resolution Fluorescence Imaging-Reference-Cited by-同舟云学术

Resolving Multi-Asperity Contacts at the Nanoscale through Super-Resolution Fluorescence Imaging

Published:2024-02-12 Issue:7 Volume:15 Page:1936-1942
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

Demirkurt Begüm¹^ORCID,Petrova Dina¹^ORCID,Sharma Dharmendar Kumar²^ORCID,Vacha Martin²^ORCID,Weber Bart³⁴^ORCID,Bonn Daniel⁴^ORCID,Brouwer Albert M.¹^ORCID

Affiliation:

1. van’t Hoff Institute for Molecular Sciences, University of Amsterdam, P.O. Box 94157, 1090 GD Amsterdam, The Netherlands

2. Tokyo Institute of Technology, Ookayama 2-12-1-S8, Meguro-ku, Tokyo 152-8552, Japan

3. Advanced Research Center for Nanolithography (ARCNL), Science Park 106, 1098 XG Amsterdam, The Netherlands

4. Institute of Physics, University of Amsterdam, P.O. Box 94485, 1090 GL Amsterdam, The Netherlands

Funder

Ministry of Education, Culture, Sports, Science and Technology

Japan Society for the Promotion of Science

Nederlandse Organisatie voor Wetenschappelijk Onderzoek

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.3c02799

Reference46 articles.

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3. Molecular probes reveal deviations from Amontons’ law in multi-asperity frictional contacts

4. Fracture mechanics determine the lengths of interface ruptures that mediate frictional motion

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