Interface Sensitivity in Electron/Ion Yield X-ray Absorption Spectroscopy: The TiO2

Interface Sensitivity in Electron/Ion Yield X-ray Absorption Spectroscopy: The TiO2–H2O Interface

Published:2021-10-14 Issue:41 Volume:12 Page:10212-10217
ISSN:1948-7185
Container-title:The Journal of Physical Chemistry Letters
language:en
Short-container-title:J. Phys. Chem. Lett.

Author:

van Spronsen Matthijs A.¹²^ORCID,Zhao Xiao²³^ORCID,Jaugstetter Maximilian⁴,Escudero Carlos⁵^ORCID,Duchoň Tomáš⁶^ORCID,Hunt Adrian⁷,Waluyo Iradwikanari⁷^ORCID,Yang Peidong²⁸^ORCID,Tschulik Kristina⁴^ORCID,Salmeron Miquel B.²³^ORCID

Affiliation:

1. Diamond Light Source Ltd., Didcot OX11 0DE, U.K.

2. Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States

3. Department of Material Science & Engineering, University of California, Berkeley, California 94720, United States

4. Department of Chemistry and Biochemistry, Ruhr-University-Bochum, 44780 Bochum, Germany

5. ALBA Synchrotron Light Source, 08290 Cerdanyola del Vallès, Spain

6. Peter Grünberg Institute PGI-6, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany

7. National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, United States

8. Department of Chemistry, University of California, Berkeley, California 94720, United States

Funder

Basic Energy Sciences

Deutsche Forschungsgemeinschaft

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

General Materials Science,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.jpclett.1c02115

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5. Introducing Ionic-Current Detection for X-ray Absorption Spectroscopy in Liquid Cells

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