New Modeling of Reflection Interference Contrast Microscopy Including Polarization and Numerical Aperture Effects: Application to Nanometric Distance Measurements and Object Profile Reconstruction
Author:
Affiliation:
1. Laboratoire Adhésion et Inflammation, INSERM U600, CNRS UMR 6212, Université de la Méditerranée, 163 Avenue de Luminy, Marseille F-13009, France
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la902504y
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