Electron-Beam-Induced Damage in Self-Assembled Monolayers
Author:
Publisher
American Chemical Society (ACS)
Subject
Physical and Theoretical Chemistry,General Engineering
Link
https://pubs.acs.org/doi/pdf/10.1021/jp960705g
Reference44 articles.
1. Chang, T. H. P.; Muray, L. P.; Staufer, U.; McCord, M. A.; Kern, D. P. InTechnology ofProximal Probe Lithography; Marrian, C. R. K., Ed.; SPIE Optical Engineering Press: Bellingham, WA, 1993; pp 127−154.
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