Probing Surface Defects of InP Quantum Dots Using Phosphorus Kα and Kβ X-ray Emission Spectroscopy-Reference-Cited by-同舟云学术

Probing Surface Defects of InP Quantum Dots Using Phosphorus Kα and Kβ X-ray Emission Spectroscopy

Published:2018-08-31 Issue:18 Volume:30 Page:6377-6388
ISSN:0897-4756
Container-title:Chemistry of Materials
language:en
Short-container-title:Chem. Mater.

Author:

Stein Jennifer L.¹^ORCID,Holden William M.²,Venkatesh Amrit³⁴^ORCID,Mundy M. Elizabeth¹,Rossini Aaron J.³⁴^ORCID,Seidler Gerald T.²^ORCID,Cossairt Brandi M.¹^ORCID

Affiliation:

1. Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States

2. Department of Physics, University of Washington, Seattle, Washington 98195-1560, United States

3. Department of Chemistry, Iowa State University, Ames, Iowa 50011, United States

4. U.S. Department of Energy Ames Laboratory, Ames, Iowa 50011, United States

Funder

Basic Energy Sciences

U.S. Department of Energy

Division of Materials Research

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,General Chemical Engineering,General Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/acs.chemmater.8b02590

Reference62 articles.

1. Comparative cradle-to-gate energy assessment of indium phosphide and cadmium selenide quantum dot displays

2. Emergence of colloidal quantum-dot light-emitting technologies

3. QLEDs for displays and solid-state lighting

4. Quantum dots: The ultimate down-conversion material for LCD displays

5. Progress in Non-Cd Quantum Dot Development for Lighting Applications

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