Ion Trapping and Detrapping in Amorphous Tungsten Oxide Thin Films Observed by Real-Time Electro-Optical Monitoring
Author:
Affiliation:
1. Department of Engineering Sciences, The Ångström Laboratory, Uppsala University, P.O. Box 534, SE-75121 Uppsala, Sweden
Funder
European Research Council
Consejo Nacional de Ciencia y Tecnolog?a
Torsten Thor?ns stiftelse f?r milj?v?nlig forskning
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,General Chemical Engineering,General Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/acs.chemmater.6b01503
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