Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy-Reference-Cited by-同舟云学术

Current Imaging and Electromigration-Induced Splitting of GaN Nanowires As Revealed by Conductive Atomic Force Microscopy

Published:2010-03-17 Issue:4 Volume:4 Page:2422-2428
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Li Chun¹,Bando Yoshio¹,Golberg Dmitri¹

Affiliation:

1. International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Namiki 1-1, Tsukuba, Ibaraki 305-004, Japan

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn100223j

Reference27 articles.

1. Microscopic Theory of Electromigration on Semiconductor Surfaces

2. SEMICONDUCTOR NANOWIRES AND NANOTUBES

3. Novel semiconducting nanowire heterostructures: synthesis, properties and applications

4. Probing Electrical Transport in Nanomaterials: Conductivity of Individual Carbon Nanotubes

5. A Liquid-Ga-Filled Carbon Nanotube: A Miniaturized Temperature Sensor and Electrical Switch

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