Measuring the Thickness of the Liquid-like Layer on Ice Surfaces with Atomic Force Microscopy-Reference-Cited by-同舟云学术

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Measuring the Thickness of the Liquid-like Layer on Ice Surfaces with Atomic Force Microscopy

Published:2000-07-11 Issue:16 Volume:16 Page:6709-6714
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Döppenschmidt Astrid¹,Butt Hans-Jürgen¹

Affiliation:

1. Institute of Physical Chemistry II, University Siegen, 57068 Siegen, Germany

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la990799w

Reference51 articles.

1. XXIV. On regelation, and on the conservation of force

2. (a) Wettlaufer, J. S.; Dash, J. G.Sci. Am.2000,Feb., 86.

3. (b) Petrenko, V. F.USACRREL Special Report; 1994; p 94.

4. Optical study of surface melting on ice

5. Ellipsometric study of the transition layer on the surface of an ice crystal

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