Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy-Reference-Cited by-同舟云学术

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Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy

Published:2010-08-10 Issue:17 Volume:82 Page:7237-7248
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Mahoney Christine M.¹,Fahey Albert J.¹,Steffens Kristen L.¹,Benner Bruce A.¹,Lareau Richard T.²

Affiliation:

1. National Institute of Standards and Technology, 100 Bureau Drive, Mail Stop 8371, Gaithersburg, Maryland 20899

2. Transportation Security Laboratory, William J. Hughes Technical Center, Building 315, Atlantic City International Airport, New Jersey 08405

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac101116r

Reference21 articles.

1. Detection of Trace Explosive Evidence by Ion Mobility Spectrometry

2. Analysis of nitramine and nitroaromatic explosives by capillary electrophoresis

3. On the Examination of the Military Explosive, C-4

4. Analysis of high-explosive samples by Fourier transform Raman spectroscopy

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