Thickness Dependence of the Optical Anisotropy for Porphyrin Octaester Langmuir−Schaefer Films-Reference-Cited by-同舟云学术

Thickness Dependence of the Optical Anisotropy for Porphyrin Octaester Langmuir−Schaefer Films

Published:2002-08-01 Issue:18 Volume:18 Page:6881-6886
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Goletti C.¹,Paolesse R.¹,Dalcanale E.¹,Berzina T.¹,Di Natale C.¹,Bussetti G.¹,Chiaradia P.¹,Froiio A.¹,Cristofolini L.¹,Costa M.¹,D'Amico A.¹

Affiliation:

1. Dipartimento di Fisica and Unità INFM, Università di Roma “Tor Vergata”, Via della Ricerca Scientifica 1, 00133 Roma, Italy, Dipartimento di Scienze e Tecnologie Chimiche and Unità INFM, Università di Roma “Tor Vergata”, Via della Ricerca Scientifica 1, 00133 Roma, Italy, Dipartimento di Chimica Organica e Industriale and Unità INSTM, Università di Parma, Parco Area delle Scienze 17/A, 43100 Parma, Italy, Dipartimento di Fisica and Unità INFM, Università di Parma, Parco Area delle Scienze 7/A, 43100...

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la025756l

Reference32 articles.

1. Organic-inorganic electronics

2. Organic electronics: Introduction

3. From Molecules to Materials: Current Trends and Future Directions

4. Organic-Inorganic Hybrid Materials as Semiconducting Channels in Thin-Film Field-Effect Transistors

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