First-Principles Simulation of Beam-Induced Processes Underlying Atomic Manipulation in Electron Microscopes-Reference-Cited by-同舟云学术

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First-Principles Simulation of Beam-Induced Processes Underlying Atomic Manipulation in Electron Microscopes

Published:2024-05-06 Issue:6 Volume:5 Page:675-686
ISSN:2643-6728
Container-title:Accounts of Materials Research
language:en
Short-container-title:Acc. Mater. Res.

Author:

Lingerfelt David B.¹^ORCID,Ganesh Panchapakesan¹^ORCID,Jakowski Jacek¹²^ORCID,Sumpter Bobby G.¹^ORCID

Affiliation:

1. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

2. Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

Funder

Basic Energy Sciences

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/accountsmr.4c00014

Reference60 articles.

1. Depth sectioning with the aberration-corrected scanning transmission electron microscope

2. Resolving hydrogen atoms at metal-metal hydride interfaces

3. Direct matter disassembly via electron beam control: electron-beam-mediated catalytic etching of graphene by nanoparticles

4. Evidence of defect formation in monolayer MoS₂at ultralow accelerating voltage electron irradiation

5. Scanning transmission electron microscopy under controlled low-pressure atmospheres

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