Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips-Reference-Cited by-同舟云学术

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Simple and Fast Method To Fabricate Single-Nanoparticle-Terminated Atomic Force Microscope Tips

Published:2013-06-19 Issue:25 Volume:117 Page:13239-13246
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

Cheng Hui-Wen,Chang Yuan-Chih,Yuan Chi-Tsu¹,Tang Song-Nien²,Chang Chia-Seng,Tang Jau³,Chen Fu-Rong,Pan Rong-Long,Tseng Fan-Gang

Affiliation:

1. Department of Physics, Chung Yuan Christian University, Chungli 32023, Taiwan

2. Medical Image Technology Department, Industrial Technology Research Institute, Hsinchu 31040, Taiwan

3. Institute of Photonics, National Chiao Tung University, Hsinchu 30010, Taiwan

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp401050t

Reference36 articles.

1. Surface Studies by Scanning Tunneling Microscopy

2. Atomic Force Microscope

3. Nanoscale materials patterning and engineering by atomic force microscopy nanolithography

4. Measurement of forces in liquids using a force microscope

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