Scanning Angle Plasmon Waveguide Resonance Raman Spectroscopy for the Analysis of Thin Polystyrene Films
Author:
Affiliation:
1. Ames Laboratory, U.S. Department of Energy, Ames, Iowa 50011-3111, United States
2. Department of Chemistry, Iowa State University, Ames, Iowa 50011-3111, United States
Publisher
American Chemical Society (ACS)
Subject
Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/jp308882w
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