Growth of Tribological Films: In Situ Characterization Based on Attenuated Total Reflection Infrared Spectroscopy-Reference-Cited by-同舟云学术

Growth of Tribological Films: In Situ Characterization Based on Attenuated Total Reflection Infrared Spectroscopy

Published:2002-07-24 Issue:17 Volume:18 Page:6606-6613
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Piras Federica M.¹,Rossi Antonella¹,Spencer Nicholas D.¹

Affiliation:

1. Laboratory for Surface Science and Technology, Department of Materials, Swiss Federal Institute of Technology, ETH Zürich, CH-8092 Zürich, Switzerland, and Department of Inorganic and Analytical Chemistry, University of Cagliari, Cagliari, Italy

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la0202733

Reference40 articles.

1. Rubbing and Scrubbing

2. In Lubro Studies of Lubricants in EHD Contacts Using FTIR Absorption Spectroscopy

3. Tribochemistry of ZDDP and MoDDP chemisorbed films

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