Measurement of sputtering yields and ion beam damage to organic thin films with the quartz crystal microbalance-Reference-Cited by-同舟云学术

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Measurement of sputtering yields and ion beam damage to organic thin films with the quartz crystal microbalance

Published:1980-08-01 Issue:9 Volume:52 Page:1467-1473
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Ullevig Dale M.,Evans John F.

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac50059a020

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