Variation in the Bandgap of Amorphous Zinc Tin Oxide: Investigating the Thickness Dependence <i>via In Situ</i> STS-Reference-Cited by-同舟云学术

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Variation in the Bandgap of Amorphous Zinc Tin Oxide: Investigating the Thickness Dependence via In Situ STS

Published:2024-01-31 Issue:6 Volume:9 Page:7262-7268
ISSN:2470-1343
Container-title:ACS Omega
language:en
Short-container-title:ACS Omega

Author:

Callaghan Peter J.¹,Caffrey David¹^ORCID,Zhussupbekov Kuanysh²^ORCID,Berman Samuel¹^ORCID,Zhussupbekova Ainur²³^ORCID,Smith Christopher M.¹,Shvets Igor V.¹

Affiliation:

1. School of Physics and Centre for Research on Adaptive Nanostructures and Nanodevices (CRANN), Trinity College Dublin, Dublin 2, Ireland

2. School of Chemistry, Trinity College Dublin, Dublin 2, Ireland

3. L.N. Gumilyov Eurasian National University, 2 Satpayev Street, Astana 010000, Kazakhstan

Funder

Engineering and Physical Sciences Research Council

Irish Research Council

Science Foundation Ireland

Ministry of Education and Science of the Republic of Kazakhstan

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsomega.3c09958

Reference44 articles.

1. Material characteristics and applications of transparent amorphous oxide semiconductors

2. Comprehensive Review on Amorphous Oxide Semiconductor Thin Film Transistor

3. Barquinha, P.; Martins, R.; Pereira, L.; Fortunato, E. Transparent Oxide Electronics: From Materials to Devices, 1st ed. Wiley, 2012; pp 9–15.

4. Recent Advances in Understanding the Structure and Properties of Amorphous Oxide Semiconductors

5. All‐Oxide Transparent Thin‐Film Transistors Based on Amorphous Zinc Tin Oxide Fabricated at Room Temperature: Approaching the Thermodynamic Limit of the Subthreshold Swing

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