Stable Oxygen Incorporation in Superconducting TaN: An Experimental and Theoretical Assessment-Reference-Cited by-同舟云学术

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Stable Oxygen Incorporation in Superconducting TaN: An Experimental and Theoretical Assessment

Published:2024-08-01 Issue:32 Volume:9 Page:35069-35079
ISSN:2470-1343
Container-title:ACS Omega
language:en
Short-container-title:ACS Omega

Author:

Quintanar-Zamora Victor¹²^ORCID,Cedillo-Rosillo Michelle¹²,Contreras-López Oscar²,Corona-Garcia Carlos Antonio²^ORCID,Reyes-Serrato Armando²,Ponce-Pérez Rodrigo²^ORCID,Guerrero-Sanchez Jonathan²^ORCID,Díaz Jesús Antonio²^ORCID

Affiliation:

1. Posgrado en Nanociencias, Centro de Investigación Científica y de Educación Superior de Ensenada, Ensenada, Baja California 22860, Mexico

2. Centro de Nanociencias y Nanotecnología, Universidad Nacional Autónoma de México, Ensenada, Baja California 22860, Mexico

Funder

Direcci?n General de Asuntos del Personal Acad?mico, Universidad Nacional Aut?noma de M?xico

THUBAT KAAL IPICYT supercomputing center

CB_CONACYT

FORDECYT

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsomega.4c05310

Reference65 articles.

1. An X-Ray Study of the Tantalum-Nitrogen System.

2. Superconducting Thin Films of Niobium, Tantalum, Tantalum Nitride, Tantalum Carbide, and Niobium Nitride

3. Structure of Tantalum Nitrides

4. Structure of Ta3N5 at 16 K by time-of-flight neutron diffraction

5. Preparation and compositional analysis of sputtered TaN films

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