Heptagons in the Basal Plane of Graphene Nanoflakes Analyzed by Simulated X-ray Photoelectron Spectroscopy-Reference-Cited by-同舟云学术

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Heptagons in the Basal Plane of Graphene Nanoflakes Analyzed by Simulated X-ray Photoelectron Spectroscopy

Published:2021-01-13 Issue:3 Volume:6 Page:2389-2395
ISSN:2470-1343
Container-title:ACS Omega
language:en
Short-container-title:ACS Omega

Author:

Kim Jungpil¹^ORCID,Han Jang-Woo²,Yamada Yasuhiro³^ORCID

Affiliation:

1. Carbon Material Application Research Group, Korea Institute of Industrial Technology, 222 Palbok-ro, Deokjin-gu, Jeonju 54853, Republic of Korea

2. Department of Mechanical Design Engineering, Kumoh National Institute of Technology, 61 Daehak-ro, Gumi 39177, Republic of Korea

3. Graduate School of Engineering, Chiba University, 1-33 Yayoi, Inage, Chiba 263-8522, Japan

Funder

Korea Institute of Industrial Technology

Publisher

American Chemical Society (ACS)

Subject

General Chemical Engineering,General Chemistry

Link

http://pubs.acs.org/doi/pdf/10.1021/acsomega.0c05717

Reference41 articles.

1. Graphene-based flexible electronic devices

2. Graphene based catalysts

3. Structural Defects in Graphene

4. Building egg-tray-shaped graphenes that have superior mechanical strength and band gap

5. Disclinations of monolayer graphite and their electronic states

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4. Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters;Applied Surface Science Advances;2024-02

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