Femtogram Detection and Quantitation of Residues Using Laser Ionization Orthogonal Time-of-Flight Mass Spectrometry-Reference-Cited by-同舟云学术

Femtogram Detection and Quantitation of Residues Using Laser Ionization Orthogonal Time-of-Flight Mass Spectrometry

Published:2009-09-10 Issue:20 Volume:81 Page:8623-8626
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Yu Quan¹,Cao Zhiyu¹,Li Lingfeng¹,Yan Bin¹,Hang Wei¹,He Jian¹,Huang Benli¹

Affiliation:

1. Department of Chemistry, Key Laboratory of Analytical Science, College of Chemistry and Chemical Engineering, State Key Laboratory of Marine Environmental Science, and Department of Mechanical and Electrical Engineering, Xiamen University, Xiamen 361005, China

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac901615k

Reference31 articles.

1. Recent trends and the future of laser-induced plasma spectroscopy

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5. Glow-discharge spectrometry for direct analysis of thin and ultra-thin solid films

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