X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface-Reference-Cited by-同舟云学术

X-ray Reflectivity Study of an Amphiphilic Hexa-peri-hexabenzocoronene at a Structured Silicon Wafer Surface

Published:2003-11-18 Issue:26 Volume:19 Page:10997-10999
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Kubowicz Stephan¹,Thünemann Andreas F.¹,Geue Thomas M.¹,Pietsch Ullrich¹,Watson Mark D.¹,Tchebotareva Natalia¹,Müllen Klaus¹

Affiliation:

1. Max Planck Institute of Colloids and Interfaces, Am Mühlenberg 1, 14476 Golm, Germany, Federal Institute for Materials Research and Testing, Richard-Willstätter-Strasse 11, 12489 Berlin, Germany, Fraunhofer Institute for Applied Polymer Research, Geiselbergstrasse 69, 14476 Golm, Germany, Institute of Physics, University of Potsdam, D-14415 Potsdam, Germany, and Max-Planck-Institut für Polymerforschung, Ackermannweg 10, 55128 Mainz, Germany

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la035210e

Reference27 articles.

1. Surface-Assisted Orientational Control of Discotic Liquid Crystals by Light

2. Polarized Photoluminescence from Photopatterned Discotic Liquid Crystal Films

3. Mono- and multilayer films of discotic metal-(alkythio)tetraazaporphyrins

4. In-plane anisotropy and phase change in Langmuir-Blodgett films of disklike molecules

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