In Situ Spectroscopic Ellipsometry Monitoring of Multilayer Growth Dynamics via Molecular Layer Epitaxy
Author:
Affiliation:
1. Inorganic and Analytical Chemistry Department, The Hebrew University of Jerusalem, Jerusalem, 91904, Israel
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la0010065
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4. In Situ Time-Resolved X-ray Reflectivity Study of Self-Assembly from Solution
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