Structural Characterization of SiO2 and Al2O3 Zener-Pinned Nanocrystalline TiO2 by NMR, XRD and Electron Microscopy-Reference-Cited by-同舟云学术

Structural Characterization of SiO2 and Al2O3 Zener-Pinned Nanocrystalline TiO2 by NMR, XRD and Electron Microscopy

Published:2007-08-23 Issue:37 Volume:111 Page:13740-13746
ISSN:1932-7447
Container-title:The Journal of Physical Chemistry C
language:en
Short-container-title:J. Phys. Chem. C

Author:

O'Dell Luke A.¹,Savin ¹,Chadwick Alan V.¹,Smith Mark E.¹

Affiliation:

1. Department of Physics, University of Warwick, Coventry, CV4 7AL, United Kingdom, and School of Physical Sciences, University of Kent, Canterbury, Kent, CT2 7NH, United Kingdom

Publisher

American Chemical Society (ACS)

Subject

Surfaces, Coatings and Films,Physical and Theoretical Chemistry,General Energy,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/jp0739871

Reference38 articles.

1. Effects of particle morphology and surface hydrogenation on the phase stability ofTiO2

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