Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector-Reference-Cited by-同舟云学术

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Adhesion Force Measurements Using an Atomic Force Microscope Upgraded with a Linear Position Sensitive Detector

Published:1994-09 Issue:9 Volume:10 Page:3217-3221
ISSN:0743-7463
Container-title:Langmuir
language:en
Short-container-title:Langmuir

Author:

Pierce M.,Stuart J.,Pungor A.,Dryden P.,Hlady V.

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/la00021a053

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