Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers-Reference-Cited by-同舟云学术

Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers

Published:2009-10-23 Issue:12 Volume:9 Page:4446-4451
ISSN:1530-6984
Container-title:Nano Letters
language:en
Short-container-title:Nano Lett.

Author:

Xu Ke¹,Cao Peigen¹,Heath James R.¹

Affiliation:

1. Kavli Nanoscience Institute and Division of Chemistry and Chemical Engineering, California Institute of Technology, MC 127-72, Pasadena, California 91125

Publisher

American Chemical Society (ACS)

Subject

Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering

Link

https://pubs.acs.org/doi/pdf/10.1021/nl902729p

Reference38 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Two-dimensional atomic crystals

3. The rise of graphene

4. The electronic properties of graphene

5. Graphene: Status and Prospects

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