Investigation of Multiphase Liquid Roughness Using an Atomic Force Microscope
Author:
Affiliation:
1. Institute of Nanoengineering and Microsystems
2. Instrument Technology Research Center, National Applied Research Laboratories, No. 20, R&D Rd. VI, Hsinchu Science Park, Hsinchu 300, Taiwan
3. Department of Power Mechanical Engineering
Publisher
American Chemical Society (ACS)
Subject
Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/la100690q
Reference37 articles.
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4. Surface roughness and adsorption isotherms of molecularly thin liquid films: An x-ray reflectivity study
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