Finite Element Method Simulation of the Field Distribution for AFM Tip-Enhanced Surface-Enhanced Raman Scanning Microscopy
Author:
Affiliation:
1. Pacific Northwest National Laboratory, Fundamental Science Division, P.O. Box 999, Richland, Washington 99352
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp022060s
Reference43 articles.
1. Atomic Force Microscope
2. Near-Field Scanning Optical Microscopy
3. Peer Reviewed: Near-Field Scanning Optical Microscopy.
4. Surface-enhanced spectroscopy
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