Mapping Octahedral Tilts and Polarization Across a Domain Wall in BiFeO3 from Z-Contrast Scanning Transmission Electron Microscopy Image Atomic Column Shape Analysis-Reference-Cited by-同舟云学术

Mapping Octahedral Tilts and Polarization Across a Domain Wall in BiFeO3 from Z-Contrast Scanning Transmission Electron Microscopy Image Atomic Column Shape Analysis

Published:2010-10-04 Issue:10 Volume:4 Page:6071-6079
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Borisevich AlbinaY.¹,Ovchinnikov Oleg S.²,Chang Hye Jung¹,Oxley Mark P.¹³,Yu Pu⁴,Seidel Jan⁴,Eliseev Eugine A.⁵,Morozovska Anna N.⁶,Ramesh Ramamoorthy⁴,Pennycook Stephen J.¹,Kalinin Sergei V.¹

Affiliation:

1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States

2. Department of Physics and Astronomy, University of Tennessee, Knoxville, Tennessee 37996, United States

3. Department of Physics, Vanderbilt University, Nashville, Tennessee, 37240 United States

4. Department of Materials Science and Engineering, University of California, Berkeley, California, 94720 United States

5. Institute for Problems of Materials Science

6. Institute of Semiconductor Physics

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

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