Large Discrete Resistance Jump at Grain Boundary in Copper Nanowire
Author:
Affiliation:
1. Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
2. University of Tennessee, Knoxville, Tennessee 37996
Publisher
American Chemical Society (ACS)
Subject
Mechanical Engineering,Condensed Matter Physics,General Materials Science,General Chemistry,Bioengineering
Link
https://pubs.acs.org/doi/pdf/10.1021/nl101734h
Reference27 articles.
1. Electronic Transport on the Nanoscale: Ballistic Transmission and Ohm’s Law
2. Surface and size effects on the electrical properties of Cu nanowires
3. Resistivity of thin Cu films with surface roughness
4. Size-dependent resistivity of metallic wires in the mesoscopic range
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