Effects of Base π-Stacking on Damage to DNA by Low-Energy Electrons
Author:
Affiliation:
1. Chemistry Department and Henry Eyring Center for Theoretical Chemistry, University of Utah, Salt Lake City, Utah 84112 and Department of Chemistry, University of Gdansk, 80-952 Gdansk, Poland
Publisher
American Chemical Society (ACS)
Subject
Physical and Theoretical Chemistry
Link
https://pubs.acs.org/doi/pdf/10.1021/jp047389n
Reference18 articles.
1. The subject was the subject of a recent popular science article: Collins, G. P. News Scan, Fatal Attachments: Extremely low energy electrons can wreck DNA.Sci. Am.2003, September issue, pp 26−28.
2. Electron Attachment Energies of the DNA Bases
3. Mechanism for Damage to DNA by Low-Energy Electrons
4. Theoretical Study of Damage to DNA by 0.2−1.5 eV Electrons Attached to Cytosine
Cited by 63 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Shape resonance induced electron attachment to cytosine: The effect of aqueous media;The Journal of Chemical Physics;2023-12-01
2. Electron Attachment to DNA: The Protective Role of Amino Acids;The Journal of Physical Chemistry A;2023-03-07
3. Electron Attachment to Wobble Base Pairs;The Journal of Physical Chemistry A;2023-01-09
4. Effects of substituent and excess electron attachment on proton transfer between the radiosensitizer base pairs in aqueous solution;Journal of Molecular Liquids;2022-11
5. Doorway Mechanism for Electron Attachment Induced DNA Strand Breaks;The Journal of Physical Chemistry Letters;2021-10-20
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3