Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations-Reference-Cited by-同舟云学术

Silicon Surface Passivation by Organic Monolayers: Minority Charge Carrier Lifetime Measurements and Kelvin Probe Investigations

Published:2003-06-20 Issue:28 Volume:107 Page:6846-6852
ISSN:1520-6106
Container-title:The Journal of Physical Chemistry B
language:en
Short-container-title:J. Phys. Chem. B

Author:

Sieval Alexander B.¹,Huisman Carolien L.¹,Schönecker Axel¹,Schuurmans Frank M.¹,van der Heide Arvid S. H.¹,Goossens Albert¹,Sinke Wim C.¹,Zuilhof Han¹,Sudhölter Ernst J. R.¹

Affiliation:

1. Laboratory of Organic Chemistry, Wageningen University, Dreijenplein 8, 6703 HB Wageningen, Laboratory of Inorganic Chemistry, Department of Chemical Technology, Delft University of Technology, Julianalaan 136, 2628 BL Delft, and Energy Research Center of the Netherlands, P.O. Box 1, 1755ZG Petten, The Netherlands

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Surfaces, Coatings and Films,Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp034314v

Reference47 articles.

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4. Novel method for minority‐carrier mobility measurement using photoconductance decay with chemically passivated and plasma damaged surfaces

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