Raman and Photocurrent Imaging of Electrical Stress-Induced p–n Junctions in Graphene
Author:
Affiliation:
1. IBM T.J. Watson Research Center, Yorktown Heights, New York 10598, United States.
Publisher
American Chemical Society (ACS)
Subject
General Physics and Astronomy,General Engineering,General Materials Science
Link
https://pubs.acs.org/doi/pdf/10.1021/nn201611r
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