Measuring Electrostatic Double-Layer Forces at High Surface Potentials with the Atomic Force Microscope-Reference-Cited by-同舟云学术

Measuring Electrostatic Double-Layer Forces at High Surface Potentials with the Atomic Force Microscope

Published:1996-01-01 Issue:41 Volume:100 Page:16700-16705
ISSN:0022-3654
Container-title:The Journal of Physical Chemistry
language:en
Short-container-title:J. Phys. Chem.

Author:

Raiteri Roberto¹,Grattarola Massimo¹,Butt Hans-Jürgen¹

Affiliation:

1. DIBE, University of Genova, via Opera Pia 11A, 16145 Genova, Italy, and Max-Planck-Institut für Biophysik, Kennedyallee 70, 60596 Frankfurt, Germany

Publisher

American Chemical Society (ACS)

Subject

Physical and Theoretical Chemistry,General Engineering

Link

https://pubs.acs.org/doi/pdf/10.1021/jp961549g

Reference32 articles.

1. A Study of Double Layer Repulsion and van der Waals Attraction in Soap Films

2. Surface Forces: Direct Measurement of Repulsive Forces due to Electrical Double Layers on Solids

3. Direct measurement of long range forces between two mica surfaces in aqueous KNO3 solutions

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