Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition-Reference-Cited by-同舟云学术

Spectroscopic Ellipsometry Study on Tuning the Electrical and Optical Properties of Zr-Doped ZnO Thin Films Grown by Atomic Layer Deposition

Published:2022-02-24 Issue:3 Volume:4 Page:925-935
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Bohórquez Carolina¹^ORCID,Bakkali Hicham²³,Delgado Juan J.³⁴^ORCID,Blanco Eduardo²³^ORCID,Herrera Manuel⁵,Domínguez Manuel²³

Affiliation:

1. Centro de Investigación Científica y de Educación Superior de Ensenada (CICESE), 22860 Ensenada, Baja California, Mexico

2. Departamento de Física de la Materia Condensada, Universidad de Cádiz, Campus de Puerto Real, E11519 Puerto Real, Spain

3. Institute of Research on Electron Microscopy and Materials (IMEYMAT), Universidad de Cádiz, Campus de Puerto Real, E11519 Puerto Real, Spain

4. Departamento Ciencias de los Materiales e Ingeniería Metalúrgica y Química Inorgánica, Universidad de Cádiz, Campus de Puerto Real, E11519 Puerto Real, Spain

5. Centro de Nanociencias y Nanotecnología, Universidad Nacional Autónoma de México, 22860 Ensenada, Baja California, Mexico

Funder

Consejo Nacional de Ciencia y Tecnolog?a

Universidad de C?diz

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.1c01026

Reference43 articles.

1. Liquid Crystals — Applications and Uses

2. Fabrication of antireflection structures on TCO film for reflective liquid crystal display

3. Highly flexible touch screen panel fabricated with silver-inserted transparent ITO triple-layer structures

4. Applications of ZnO in organic and hybrid solar cells

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