SiO2/HfO2 Laser Film with Enhanced Protection and Antireflection for Sapphire Infrared Windows at High Temperatures-Reference-Cited by-同舟云学术

SiO2/HfO2 Laser Film with Enhanced Protection and Antireflection for Sapphire Infrared Windows at High Temperatures

Published:2021-10-18 Issue:10 Volume:3 Page:4611-4617
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Zhao Da-Qiang¹,Xu Fan¹²,Wang Gui-Gen¹^ORCID,Zhang Si-Ying¹,Qin Guo-Shuang¹,Wang Bao-Lin²,Han Jie-Cai¹³

Affiliation:

1. Shenzhen Key Laboratory for Advanced Materials, School of Materials Science and Engineering, Harbin Institute of Technology (Shenzhen), Building D, HIT Campus, University Town of Shenzhen, Nanshan, Shenzhen 518055, P. R. China

2. School of Science, Harbin Institute of Technology (Shenzhen), Building G, HIT Campus, University Town of Shenzhen, Nanshan, Shenzhen 518055, P. R. China

3. National Key Laboratory of Science and Technology on Advanced Composites in Special Environments, Harbin Institute of Technology, No. 2 YiKuang Street, Nangang, Harbin 150080, P. R. China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Guangdong Province

Shenzhen Constantly-supported Project for Universities and Colleges

National Key Laboratory of Science and Technology on Advanced Composites in Special Environments

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.1c00761

Reference35 articles.