Fabrication of CFETs with Vertically Stacked p-SiGe/n-Si Channels by SiGe/Ge/Si Multilayer Epitaxy and Ge Selective Etching

Author:

Chu Chun-Lin1,Chen Szu-Hung1,Chang Wei-Yuan1,Hsu Shu-Han2ORCID,Luo Guang-Li1ORCID,Wu Wen-Fa1

Affiliation:

1. Taiwan Semiconductor Research Institute, National Applied Research Laboratories, Hsinchu 30076, Taiwan

2. School of Integrated Science and Technology (ISI), Sirindhorn International Institute of Technology (SIIT), Thammasat University, Pathum Thani 12120, Thailand

Publisher

American Chemical Society (ACS)

Reference12 articles.

1. A Three-Dimensional Stacked Fin-CMOS Technology for High-Density ULSI Circuits

2. Vandooren, A.; Parihar, N.; Franco, J.; Loo, R.; Arimura, H.; Rodriguez, R.; Sebaai, F.; Iacovo, S.; Vandersmissen, K.; Li, W.; Mannaert, G.; Radisic, D.; Rosseel, E.; Hikavyy, A.; Jourdain, A.; Mourey, O.; Gaudin, G.; Reboh, S.; Van- Jodin, L. L.; Besnard, G.; Roda Neve, C.; Nguyen, B. Y.; Radu, I.; Litta, E. D.; Horiguchi, N. Demonstration of 3D sequential FD-SOI on CMOS FinFET stacking featuring low temperature Si layer transfer and top tier device fabrication with tier interconnections. In 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits), Honolulu, HI, USA, 2022; pp 330–331. 10.1109/VLSITechnologyandCir46769.2022.9830400.

3. Subramanian, S.; Hosseini, M.; Chiarella, T.; Sarkar, S.; Schuddinck, P.; Chan, B. T.; Radisic, D.; Mannaert, G.; Hikavyy, A.; Rossee, E.; Sebaai, F.; Peter, A.; Hopf, T.; Morin, P.; Wang, S.; Devriendt, K.; Batuk, D. G.; Martinez, T.; Veloso, A.; Litta, E. D.; Baudot, S.; Siew, Y. K.; Zhou, X.; Briggs, B.; Capogreco, E.; Hung, J.; Koret, R.; Spessot, A.; Ryckaert, J.; Demuynck, S.; Horiguchi, N.; Boemmels, J. First Monolithic Integration of 3D Complementary FET (CFET) on 300mm Wafers. In IEEE Symposium on VLSI Technology, Honolulu, HI, USA, 2020; pp 1–2. 10.1109/VLSITechnology18217.2020.9265073.

4. Huang, C. Y.; Dewey, G.; Mannebach, E.; Phan, A.; Morrow, P.; Rachmady, W.; Tung, I. C.; Thomas, N.; Alaan, U.; Paul, R.; Kabir, N.; Krist, B.; Oni, A.; Mehta, M.; Harper, M.; Nguyen, P.; Keech, R.; Vishwanath, S.; Cheong, K. L.; Kang, J. S.; Lilak, A.; Metz, M.; Clendenning, S.; Turkot, B.; Schenker, R. H.; Yoo, J.; Radosavljevic, M.; Kavalieros, J. 3-D Self-aligned Stacked NMOS-on-PMOS Nanoribbon Transistors for Continued Moore’s Law Scaling. In IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2020; pp 20.6.1–20.6.4. 10.1109/IEDM13553.2020.9372066.

5. First Demonstration of Vertically Stacked Gate-All-Around Highly Strained Germanium Nanowire pFETs

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