Nanoscale Electrical Probes on a Single Facet of a ZnO Microwire: Device Fabrication and Local Electrical Characteristics-Reference-Cited by-同舟云学术

Nanoscale Electrical Probes on a Single Facet of a ZnO Microwire: Device Fabrication and Local Electrical Characteristics

Author:

Yun Yoojoo¹,Shin Dong Hoon²,Kim Hakseong³,Choi Jun Hee⁴,Jeong Hyunjeong⁵,Suh Dongseok⁶^ORCID,Kang Haeyong¹^ORCID,Lee Sang Wook⁵^ORCID

Affiliation:

1. Department of Physics and Research Center for Dielectric and Advanced Matter Physics, Pusan National University, Busan 46241, Korea

2. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft, The Netherlands

3. Korea Research Institute of Standards and Science (KRISS), Daejeon 34113, Korea

4. Defense Agency for Technology and Quality, Jinju, Gyeongsangnam-do 52851, Korea

5. Department of Physics, Ewha Womans University, Seoul 03760, Korea

6. Department of Energy Science, Sungkyunkwan University, Suwon 16419, Korea

Funder

Ministry of Education

Ministry of Trade, Industry and Energy

National Research Foundation

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

Reference24 articles.

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