Growth and Atomically Resolved Polarization Mapping of Ferroelectric Bi2WO6 Thin Films-Reference-Cited by-同舟云学术

Growth and Atomically Resolved Polarization Mapping of Ferroelectric Bi2WO6 Thin Films

Published:2021-01-25 Issue:2 Volume:3 Page:1023-1030
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Jeong Jihwan¹²,Mun Junsik¹³,Das Saikat¹²^ORCID,Kim Jinkwon¹²,Kim Jeong Rae¹²,Peng Wei¹²,Kim Miyoung¹³^ORCID,Noh Tae Won¹²^ORCID

Affiliation:

1. Center for Correlated Electron Systems, Institute for Basic Science (IBS), Seoul 08826, Korea

2. Department of Physics and Astronomy, Seoul National University, Seoul 08826, Korea

3. Department of Materials Science and Engineering and Research Institute of Advanced Materials, Seoul National University, Seoul 08826, Republic of Korea

Funder

Institute for Basic Science

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.1c00005

Reference25 articles.

1. Recent Developments in Oxide Ion Conductors: Aurivillius Phases

2. Understanding ferroelectricity in layered perovskites: new ideas and insights from theory and experiments

3. Fatigue-free ferroelectric capacitors with platinum electrodes

4. Robust In‐Plane Ferroelectricity in Ultrathin Epitaxial Aurivillius Films

5. Evolution of structure and ferroelectricity in Aurivillius Bi4Bin−3Fen−3Ti3O3n+3 thin films

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