MOCVD Growth and Characterization of Be-Doped GaN
Author:
Affiliation:
1. College of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203-3613, United States
2. Department of Physics, Virginia Commonwealth University, Richmond, Virginia 23284-2000, United States
Funder
Division of Materials Research
Publisher
American Chemical Society (ACS)
Subject
Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials
Link
https://pubs.acs.org/doi/pdf/10.1021/acsaelm.1c01276
Reference47 articles.
1. Ion Implantation-Based Edge Termination to Improve III-N APD Reliability and Performance
2. Mg Incorporation Efficiency in Pulsed MOCVD of N-Polar GaN:Mg
3. Drain-Voltage-Induced Secondary Effects in AlGaN/GaN HEMTs With Integrated Body-Diode
4. Impurity incorporation and diffusion from regrowth interfaces in N-polar GaN photocathodes and the impact on quantum efficiency
5. Investigation of the Effects of Forming Gas Annealing on Al2O3/GaN Interface
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