Ultimate High Conductivity of Multilayer Graphene Examined by Multiprobe Scanning Tunneling Potentiometry on Artificially Grown High-Quality Graphite Thin Film-Reference-Cited by-同舟云学术

Ultimate High Conductivity of Multilayer Graphene Examined by Multiprobe Scanning Tunneling Potentiometry on Artificially Grown High-Quality Graphite Thin Film

Published:2019-08-09 Issue:9 Volume:1 Page:1762-1771
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Mogi Hiroyuki¹,Bamba Takafumi¹,Murakami Mutsuaki²,Kawashima Yuki²,Yoshimura Masamichi³,Taninaka Atsushi¹,Yoshida Shoji¹,Takeuchi Osamu¹,Oigawa Haruhiro¹,Shigekawa Hidemi¹^ORCID

Affiliation:

1. Faculty of Pure and Applied Sciences, University of Tsukuba, Tsukuba 305-8573, Japan

2. Materials Solutions New Research Engine, KANEKA Corporation, Osaka 566-0072, Japan

3. Graduate School of Engineering, Toyota Technological Institute, Nagoya 466-8511, Japan

Funder

Japan Society for the Promotion of Science

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Electrochemistry,Electronic, Optical and Magnetic Materials

Link

http://pubs.acs.org/doi/pdf/10.1021/acsaelm.9b00298