Mid-Infrared Photothermal Imaging of Photochemically Patterned Polymer Gate Dielectrics for Organic Thin-Film Transistors-Reference-Cited by-同舟云学术

Mid-Infrared Photothermal Imaging of Photochemically Patterned Polymer Gate Dielectrics for Organic Thin-Film Transistors

Published:2024-03-18 Issue:4 Volume:6 Page:2584-2593
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Kato Ryo¹²³^ORCID,Taguchi Koki⁴⁵⁶^ORCID,Uemura Takafumi⁵⁶^ORCID,Yano Taka-aki¹²³^ORCID,Petritz Andreas⁷^ORCID,Stadlober Barbara⁷^ORCID,Sekitani Tsuyoshi⁴⁵⁶^ORCID,Tanaka Takuo¹²³^ORCID

Affiliation:

1. Institute of Post-LED Photonics, Tokushima University, 2-1 Minamijosanjima-cho, Tokushima, Tokushima 770-8506, Japan

2. Innovative Photon Manipulation Research Team, RIKEN Center for Advanced Photonics, Wako, Saitama 351-0198, Japan

3. Metamaterials Laboratory, RIKEN Cluster for Pioneering Research, Wako, Saitama 351-0198, Japan

4. Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

5. SANKEN (The Institute of Scientific and Industrial Research) Osaka University, 8-1, Mihogaoka, Ibaraki, Osaka 567-0047, Japan

6. Advanced Photonics and Biosensing Open Innovation Laboratory, National Institute of Advanced Industrial Science and Technology (AIST), 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan

7. JOANNEUM RESEARCH Forschungsgesellschaft mbH MATERIALS─Institute for Sensors, Photonics and Manufacturing Technologies, Franz-Pichler Straße 30, Weiz 8160, Austria

Funder

New Energy and Industrial Technology Development Organization

Murata Science Foundation

Casio Science Promotion Foundation

Japan Society for the Promotion of Science

Japan Science and Technology Corporation

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.4c00161

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