Correlation between the Cross-Plane Thermal and Electrical Conductance in Randomly Stacked MoS<sub>2</sub>-Reference-Cited by-同舟云学术

Correlation between the Cross-Plane Thermal and Electrical Conductance in Randomly Stacked MoS₂

Published:2024-07-31 Issue: Volume: Page:
ISSN:2637-6113
Container-title:ACS Applied Electronic Materials
language:en
Short-container-title:ACS Appl. Electron. Mater.

Author:

Zhou Kaiyao¹,Ueji Kan¹²^ORCID,Shiga Takuma²^ORCID,Nishidome Hiroyuki¹^ORCID,Saito Shigeki¹,Nakamura Sota¹,Endo Takahiko¹,Yomogida Yohei¹^ORCID,Miyata Yasumitsu¹,Kobayashi Junei³,Yamamoto Takahiro³,Yagi Takashi²,Yanagi Kazuhiro¹^ORCID

Affiliation:

1. Department of Physics, Tokyo Metropolitan University, Hachioji, Tokyo 192-0397, Japan

2. National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), Umezono, Tsukuba, Ibaraki 305-8563, Japan

3. Department of Physics, Tokyo University of Science, 1-3 Kagurazaka, Shinjuku-ku, Tokyo 162-8601, Japan

Funder

Tokyo Metropolitan Government

Core Research for Evolutional Science and Technology

Thermal and Electric Energy Technology Foundation

Precise Measurement Technology Promotion Foundation

Japan Society for the Promotion of Science

Japan Science and Technology Agency

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaelm.4c00911

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4. Ultralow Thermal Conductivity in Disordered, Layered WSe 2 Crystals

5. Engineering Heat Transport Across Epitaxial Lattice-Mismatched van der Waals Heterointerfaces