Capturing Wetting States in Nanopatterned Silicon-Reference-Cited by-同舟云学术

Capturing Wetting States in Nanopatterned Silicon

Published:2014-01-13 Issue:1 Volume:8 Page:885-893
ISSN:1936-0851
Container-title:ACS Nano
language:en
Short-container-title:ACS Nano

Author:

Xu XiuMei¹,Vereecke Guy¹,Chen Chang¹²,Pourtois Geoffrey¹³,Armini Silvia¹,Verellen Niels¹²,Tsai Wei-Kang⁴,Kim Dong-Wook⁵,Lee Eunsongyi⁵,Lin Chang-You²,Van Dorpe Pol¹²,Struyf Herbert¹,Holsteyns Frank¹,Moshchalkov Victor²,Indekeu Joseph²,De Gendt Stefan¹²

Affiliation:

1. IMEC, Kapeldreef 75, Leuven 3001, Belgium

2. Department of Physics and Astronomy, Department of Chemistry, KU Leuven, Leuven 3001, Belgium

3. Department of Chemistry, PLASMANT, University of Antwerp, B-2610 Wilrijk, Belgium

4. Department of Material Science and Engineering, University of Southern California, Los Angeles, California 90089, United States

5. Department of Physics, Ewha Womans University, Seoul 120-750, Korea

Publisher

American Chemical Society (ACS)

Subject

General Physics and Astronomy,General Engineering,General Materials Science

Link

https://pubs.acs.org/doi/pdf/10.1021/nn405621w

Reference51 articles.

1. Wetting: statics and dynamics

2. Non-sticking drops

3. Design and Creation of Superwetting/Antiwetting Surfaces

4. Wettability Switching Techniques on Superhydrophobic Surfaces

5. Wetting and Roughness

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