Principal Component Analysis: A Versatile Method for Processing and Investigation of XPS Spectra-Reference-Cited by-同舟云学术

Principal Component Analysis: A Versatile Method for Processing and Investigation of XPS Spectra

Published:2008-08-30 Issue:19 Volume:80 Page:7226-7238
ISSN:0003-2700
Container-title:Analytical Chemistry
language:en
Short-container-title:Anal. Chem.

Author:

Mc Evoy Kevin M.¹,Genet Michel J.¹,Dupont-Gillain Christine C.¹

Affiliation:

1. Unité de Chimie des Interfaces, Université Catholique de Louvain, Croix du Sud 2/18, 1348 Louvain-la-Neuve, Belgium

Publisher

American Chemical Society (ACS)

Subject

Analytical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ac8005878

Reference27 articles.

1. Briggs, D.InSurface Analysis by Auger and X-ray Photoelectron Spectroscopy;Briggs, D. and Grant, J. T., Eds.IM Publications and Surface Spectra Ltd.:Chichester, 2003; pp31−56.

2. Noise reduction in X-ray photoelectron spectromicroscopy by a singular value decomposition sorting procedure

3. Decomposition of dimethyl methylphosphonate on TiO2(110): principal component analysis applied to X-ray photoelectron spectroscopy

4. XPS spectromicroscopy: exploiting the relationship between images and spectra

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