Liquid Ink Deposition from an Atomic Force Microscope Tip: Deposition Monitoring and Control of Feature Size

Author:

O’Connell Cathal D.1,Higgins Michael J.1,Marusic David1,Moulton Simon E.1,Wallace Gordon G.1

Affiliation:

1. ARC Centre of Excellence for Electromaterials Science, Intelligent Polymer Research Institute, AIIM Facility, Innovation Campus, University of Wollongong, Wollongong, NSW 2522, Australia

Publisher

American Chemical Society (ACS)

Subject

Electrochemistry,Spectroscopy,Surfaces and Interfaces,Condensed Matter Physics,General Materials Science

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