Assessment of Various Electronic Structure Methods for Characterizing Temporary Anion States: Application to the Ground State Anions of N2, C2H2, C2H4, and C6H6-Reference-Cited by-同舟云学术

Assessment of Various Electronic Structure Methods for Characterizing Temporary Anion States: Application to the Ground State Anions of N2, C2H2, C2H4, and C6H6

Published:2014-02-18 Issue:35 Volume:118 Page:7489-7497
ISSN:1089-5639
Container-title:The Journal of Physical Chemistry A
language:en
Short-container-title:J. Phys. Chem. A

Author:

Falcetta Michael F.¹,DiFalco Laura A.¹,Ackerman Daniel S.¹,Barlow John C.¹,Jordan Kenneth D.²

Affiliation:

1. Grove City College, Grove City, Pennsylvania 16127, United States

2. University of Pittsburgh, Pittsburgh, Pennsylvania 15260, United States

Funder

National Science Foundation

Publisher

American Chemical Society (ACS)

Subject

Physical and Theoretical Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/jp5003287

Reference106 articles.

1. Resonant Formation of DNA Strand Breaks by Low-Energy (3 to 20 eV) Electrons

2. How Do Low-Energy (0.1−2 eV) Electrons Cause DNA-Strand Breaks?

3. Electron attachment to molecules at low electron energies

4. Fundamental Electron Interactions with Plasma Processing Gases

5. Temporary anion states and dissociative electron attachment to nitrobenzene derivatives

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