Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X-ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni

Rapid Identification of Areas of Interest in Thin Film Materials Libraries by Combining Electrical, Optical, X-ray Diffraction, and Mechanical High-Throughput Measurements: A Case Study for the System Ni–Al

Published:2014-11-18 Issue:12 Volume:16 Page:686-694
ISSN:2156-8952
Container-title:ACS Combinatorial Science
language:en
Short-container-title:ACS Comb. Sci.

Author:

Thienhaus S.¹,Naujoks D.¹,Pfetzing-Micklich J.¹,König D.¹,Ludwig A.¹

Affiliation:

1. Institute for Materials, Ruhr-Universität Bochum, 44780 Bochum, Germany

Funder

Deutsche Forschungsgemeinschaft

Publisher

American Chemical Society (ACS)

Subject

General Chemistry,General Medicine

Link

https://pubs.acs.org/doi/pdf/10.1021/co5000757

Reference27 articles.

1. Combinatorial materials synthesis

2. A Combinatorial Approach for Structural Materials

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5. Applications of high throughput (combinatorial) methodologies to electronic, magnetic, optical, and energy-related materials

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