Direct Quantitative Characterization of Polymer Brushes Obtained by Surface-Initiated ATRP on Silicon-Reference-Cited by-同舟云学术

Direct Quantitative Characterization of Polymer Brushes Obtained by Surface-Initiated ATRP on Silicon

Published:2022-12-20 Issue:1 Volume:5 Page:517-528
ISSN:2637-6105
Container-title:ACS Applied Polymer Materials
language:en
Short-container-title:ACS Appl. Polym. Mater.

Author:

Gouget-Laemmel Anne-Chantal¹^ORCID,Zidelmal Nacim²,Soares Rafaela S. B.¹^ORCID,Barroca-Aubry Nadine²^ORCID,Dragoe Diana²^ORCID,Costa Ludovic²^ORCID,Lepoittevin Bénédicte³^ORCID,Salmi-Mani Hanène²^ORCID,Mellah Mohamed²^ORCID,Henry-de-Villeneuve Catherine¹^ORCID,Ozanam François¹^ORCID,Schulz Emmanuelle²^ORCID,Roger Philippe²^ORCID

Affiliation:

1. Laboratoire de Physique de la Matière Condensée, CNRS, Ecole Polytechnique, Institut Polytechnique de Paris, 91120 Palaiseau, France

2. Institut de Chimie Moléculaire et des Matériaux d’Orsay, Université Paris-Saclay, CNRS, 91405 Orsay Cedex, France

3. Laboratoire de Chimie Moléculaire et Thio-organique (LCMT), Normandie Univ, ENSICAEN, UNICAEN, CNRS, 14000 Caen, France

Funder

Agence Nationale de la Recherche

Publisher

American Chemical Society (ACS)

Subject

Organic Chemistry,Polymers and Plastics,Process Chemistry and Technology

Link

https://pubs.acs.org/doi/pdf/10.1021/acsapm.2c01632