Molecular Weight Effects on Polystyrene Fingerprint Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectra-Reference-Cited by-同舟云学术

Molecular Weight Effects on Polystyrene Fingerprint Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectra

Published:1997-10-01 Issue:21 Volume:30 Page:6407-6416
ISSN:0024-9297
Container-title:Macromolecules
language:en
Short-container-title:Macromolecules

Author:

Vanden Eynde X.¹,Bertrand P.¹,Jérôme R.²

Affiliation:

1. Unité de Physico-Chimie et de Physique des Matériaux (PCPM), Université Catholique de Louvain, Place Croix du Sud 1, 1348 Louvain-la-Neuve, Belgium

2. Center for Education and Research on Macromolecules (CERM), University of Liège, Bat. B6, Sart-Tilman, B-4000 Liège, Belgium

Publisher

American Chemical Society (ACS)

Subject

Materials Chemistry,Inorganic Chemistry,Polymers and Plastics,Organic Chemistry

Link

https://pubs.acs.org/doi/pdf/10.1021/ma9702049

Reference33 articles.

1. Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

2. Impact of mass spectrometry in surface analysis

3. Time‐of‐flight secondary ion mass spectrometry of polymer materials

4. Analysis of polymer surfaces by SIMS. 2?fingerprint spectra from simple polymer films

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